首页> 外国专利> - SYSTEM AND METHOD OF FULL-WAVE ANALYSIS FOR INTERCONNECT LINES

- SYSTEM AND METHOD OF FULL-WAVE ANALYSIS FOR INTERCONNECT LINES

机译:-互连线全波分析的系统和方法

摘要

PURPOSE: A full-wave simulation system and method for interpreting an interconnect line is provided to analyze an electromagnetic phenomenon in an interconnect line and analyze an electromagnetic phenomenon by processing a structure creation automatically through a layout schema with respect to a structure to be analyzed by a user and through a combination with a full-wave method. CONSTITUTION: A structure to be analyzed is selected for analyzing an electromagnetic phenomenon in an interconnect line(101). A user schematizes a line structure at each layer with respect to the selected structure using a layout editor(102). A structure of the schematized lines at each layer is created in a three-dimensional structure through a structure generator(103). A voltage and a pulse are applied to the created interconnect line structure, an electromagnetic phenomenon interpreter is performed using a finite difference time area method(104) thereto, and the result is output using a graphic processor(105).
机译:目的:提供一种用于解释互连线的全波仿真系统和方法,以分析互连线中的电磁现象并通过针对要分析的结构通过布局方案自动处理结构创建来分析电磁现象。用户并通过与全波方法结合使用。组成:选择要分析的结构以分析互连线中的电磁现象(101)。用户使用布局编辑器(102)相对于所选择的结构在每层上图示线路结构。通过结构生成器(103)以三维结构创建每一层上的示意性线的结构。将电压和脉冲施加到所创建的互连线结构,对其使用有限时差时域方法(104)执行电磁现象解释器,并使用图形处理器(105)输出结果。

著录项

  • 公开/公告号KR20020077298A

    专利类型

  • 公开/公告日2002-10-11

    原文格式PDF

  • 申请/专利权人 CHOI IK JOON;WON TAE YOUNG;

    申请/专利号KR20020049932

  • 发明设计人 CHOI IK JOON;WON TAE YOUNG;

    申请日2002-08-23

  • 分类号G06F17/50;

  • 国家 KR

  • 入库时间 2022-08-22 00:30:15

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号