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Baseband Analog Chipset Performance Test Apparatus and Method for Digital Cellular Terminal

机译:数字蜂窝终端的基带模拟芯片组性能测试装置和方法

摘要

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a performance test apparatus and method for a baseband analog chipset that converts intermediate frequency signals, baseband analog signals, and digital signals from digital cellular terminals. The present invention relates to a device and a method for testing the baseband analog chipset performance even when the finished product is not implemented.;The present invention implements a predetermined program for interfacing with a baseband analog chipset in an FPGA, stores necessary data corresponding to the implemented program in a nonvolatile memory, and drives the baseband according to driving of the program and data. Generates an arbitrary frequency signal corresponding to the transmission system of the analog chipset, performs the test based on the result, converts the serial signal into a parallel signal, and processes the analysis of the logic analyzer, and converts the serial digital signal into a parallel digital signal. And a test apparatus for performing baseband analog chipset performance test according to the signal amplification degree, the number of signals, and the frequency control operation by performing A / D converter testing.
机译:性能测试设备和方法技术领域本发明涉及一种用于基带模拟芯片组的性能测试设备和方法,该设备和方法转换来自数字蜂窝终端的中频信号,基带模拟信号和数字信号。本发明涉及一种即使在没有实现成品的情况下也能测试基带模拟芯片组性能的装置和方法。本发明实现了一种用于与基带模拟芯片组接口的预定程序在FPGA中,存储与在非易失性存储器中实现的程序,并根据程序和数据的驱动来驱动基带。生成与模拟芯片组的传输系统相对应的任意频率信号,根据结果进行测试,将串行信号转换为并行信号,对逻辑分析仪进行分析,然后将串行数字信号转换为并行信号数字信号。一种测试设备,用于通过执行A / D转换器测试,根据信号放大程度,信号数量和频率控制操作来执行基带模拟芯片组性能测试。

著录项

  • 公开/公告号KR100322014B1

    专利类型

  • 公开/公告日2002-07-02

    原文格式PDF

  • 申请/专利权人 삼성전자 주식회사;

    申请/专利号KR19980055400

  • 发明设计人 원연수;서호수;이창균;

    申请日1998-12-16

  • 分类号H04B1/69;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:59

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