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Baseband Analog Chipset Performance Test Apparatus and Method for Digital Cellular Terminal
Baseband Analog Chipset Performance Test Apparatus and Method for Digital Cellular Terminal
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机译:数字蜂窝终端的基带模拟芯片组性能测试装置和方法
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摘要
BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a performance test apparatus and method for a baseband analog chipset that converts intermediate frequency signals, baseband analog signals, and digital signals from digital cellular terminals. The present invention relates to a device and a method for testing the baseband analog chipset performance even when the finished product is not implemented.;The present invention implements a predetermined program for interfacing with a baseband analog chipset in an FPGA, stores necessary data corresponding to the implemented program in a nonvolatile memory, and drives the baseband according to driving of the program and data. Generates an arbitrary frequency signal corresponding to the transmission system of the analog chipset, performs the test based on the result, converts the serial signal into a parallel signal, and processes the analysis of the logic analyzer, and converts the serial digital signal into a parallel digital signal. And a test apparatus for performing baseband analog chipset performance test according to the signal amplification degree, the number of signals, and the frequency control operation by performing A / D converter testing.
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