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COMPOUND SWITCHING MATRIX FOR PROBING AND INTERCONNECTING DEVICES UNDER TEST TO MEASUREMENT EQUIPMENT

机译:用于测试设备的探针和互连设备的复合开关矩阵

摘要

The complex switching matrix 30 operates with the resistance measurement system 20 and the laser 22 to quickly and precisely trim the resistance to a predetermined value while the resistance 12 is being measured. The complex switching matrix is implemented with dry relays 34 to 81 and 101 to 164 and includes probe switching matrices 90 to 97 and a configuration matrix 32. The probe switching matrix and the configuration matrix are guarding ) Or reduce the number of average relay contacts required per probe to implement 2-, 3-, and 4-terminal measurements without protection. In addition, the discrete probe switching and measurement configuration matrix effectively isolates the high and low sides of the measurement, thereby reducing the effects of stray resistance and capacitance on the measurement speed and accuracy. Switchable ground configurations 82-89 further improve the accuracy of the measurements. The complex switching matrix of the present invention enables sequential resistance measurements on individual resistors on the array with 2-, 3-, 4-terminal measurement configurations applied to resistors with values ranging from less than 0.1 OMEGA to more than 100 MEGA do.
机译:复合开关矩阵30与电阻测量系统20和激光器22一起操作,以在测量电阻12的同时将电阻快速精确地修整到预定值。复杂的开关矩阵由干式继电器34至81和101至164来实现,并且包括探头开关矩阵90至97和配置矩阵32。探头开关矩阵和配置矩阵具有保护作用)或减少所需的平均继电器触点数量每个探头无需保护即可执行2端子,3端子和4端子测量。此外,离散的探头开关和测量配置矩阵有效地隔离了测量的高端和低端,从而减少了杂散电阻和电容对测量速度和精度的影响。可切换的接地配置82-89进一步提高了测量的准确性。本发明的复合开关矩阵使得能够对阵列上的各个电阻器进行顺序的电阻测量,其中将2、3、4端测量配置应用于电阻器,其值范围从小于0.1OMEGA到大于100MEGA。

著录项

  • 公开/公告号KR1003558790000B1

    专利类型

  • 公开/公告日2002-10-12

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR1020007007024

  • 发明设计人 패일쏘프로버트엠.;

    申请日2000-06-22

  • 分类号G01R1/20;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:24

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