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X-ray computer tomography apparatus, determines the attenuation correction function appropriate to patient, from measurements on filter and reference materials

机译:X射线计算机断层摄影设备根据对滤光片和参考材料的测量确定适合患者的衰减校正功能

摘要

Evaluation unit (22) stores a correction function k(z). For each total attenuation (g), the component patient (14) attenuation (p) is calculated from a function having terms for filter (16) attenuation in respective projection region, location terms and constants. k(z) is determined by combining filter material and reference material to get reference total attenuations at various thicknesses, accounting for beam hardening. From these results an attenuation error function is determined, in terms of error attributable to filter and reference material thickness, and theoretical, individual linear attenuations for these materials. A further intermediate function and its constants are evaluated to determine an attenuation error along a reference curve in the attenuation error characteristic diagram, finally evaluating the correction function k(z).
机译:评估单元(22)存储校正函数k(z)。对于每个总衰减(g),从具有在各个投影区域中的滤波器(16)衰减项,位置项和常数的项的函数来计算分量患者(14)的衰减(p)。 k(z)是通过将滤镜材料和参考材料组合在一起以获得各种厚度的参考总衰减而确定的,这考虑到了光束硬化。从这些结果中,根据归因于滤波器和参考材料厚度的误差以及这些材料的理论上的,个别的线性衰减,确定了衰减误差函数。评估另一个中间函数及其常数,以确定沿衰减误差特性图中参考曲线的衰减误差,最后评估校正函数k(z)。

著录项

  • 公开/公告号DE10035984C1

    专利类型

  • 公开/公告日2002-01-31

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE2000135984

  • 发明设计人 STIERSTORFER KARL;

    申请日2000-07-24

  • 分类号A61B6/03;G01N23/06;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:33

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