首页> 外国专利> Fluorescent X-ray analysis apparatus for specimen analysis, consists of sub-computers connected to main computer through network, by which offline specimen analysis operation is performed

Fluorescent X-ray analysis apparatus for specimen analysis, consists of sub-computers connected to main computer through network, by which offline specimen analysis operation is performed

机译:用于标本分析的荧光X射线分析设备,包括通过网络连接到主计算机的子计算机,通过该子计算机可以进行离线标本分析操作

摘要

Fluorescent X-ray analysis apparatus consists of a housing (1) connected to the main computer (2). Sub-computers (4,5) are connected to the main computer through the communication network (3). The main computer performs real time analysis of the specimen and displays the progress of analysis. Offline operation is performed by the sub-computers.
机译:荧光X射线分析设备由连接到主计算机(2)的外壳(1)组成。子计算机(4,5)通过通信网络(3)连接到主计算机。主计算机对标本进行实时分析并显示分析进度。离线操作由子计算机执行。

著录项

  • 公开/公告号DE10051878A1

    专利类型

  • 公开/公告日2002-05-08

    原文格式PDF

  • 申请/专利权人 RIGAKU INDUSTRIAL CORPORATION TAKATSUKI;

    申请/专利号DE2000151878

  • 发明设计人 KITA HIROAKI;

    申请日2000-10-19

  • 分类号G01N35/00;G01N23/223;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:25

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