首页> 外国专利> Magneto-resistive random-access memory device uses selection transistors of wide channel width associated with several magnetic tunnel junction memory cells

Magneto-resistive random-access memory device uses selection transistors of wide channel width associated with several magnetic tunnel junction memory cells

机译:磁阻随机存取存储设备使用与几个磁性隧道结存储单元相关的宽沟道宽度的选择晶体管

摘要

The memory device has a matrix of magnetic tunnel junction memory cells (1), each connected between a bit line (B1-B4) and a plate line (PL), with selection transistors coupled to the plate line connected at their gate electrodes to perpendicular word lines (W1-W4). Each selection transistor is associated with several magnetic tunnel junction memory cells, with its channel width determined by the number of associated magnetic tunnel junction memory cells.
机译:该存储器件具有一个磁性隧道结存储单元(1)的矩阵,每个矩阵连接在位线(B1-B4)和板极线(PL)之间,耦合到该板极线的选择晶体管在其栅极连接至垂直字线(W1-W4)。每个选择晶体管与几个磁性隧道结存储单元相关联,其沟道宽度由相关的磁性隧道结存储单元的数量确定。

著录项

  • 公开/公告号DE10056159A1

    专利类型

  • 公开/公告日2002-05-23

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE20001056159

  • 申请日2000-11-13

  • 分类号H01L27/22;G11C11/02;G11C11/15;G11C11/16;G11C11/14;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:21

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