首页> 外国专利> Source of light for illumination in a scan microscope has an electromagnetic source of power emitting light for a wavelength while upstream to a device for apportioning light into two dividing beams of light.

Source of light for illumination in a scan microscope has an electromagnetic source of power emitting light for a wavelength while upstream to a device for apportioning light into two dividing beams of light.

机译:扫描显微镜中用于照明的光源具有电磁光源,该电磁光源发射波长为一定波长的光,而该光源位于将光分配到两个分开的光束的设备的上游。

摘要

An electromagnetic source of power (3) emits light (17) for a wavelength and is upstream to a device (5) for apportioning light into two dividing beams of light. There is an intermediate element (9) in the first dividing beam of light (21) to alter wavelengths. The second dividing beam of light (19) is aligned directly onto a specimen (41) to give optical stimulation to a first area. An Independent claim is also included for a scan microscope with a microscope lens, a detector and a beam deflector device for guiding an illuminating light beam over a specimen.
机译:电磁功率源(3)发出一定波长的光(17),并且位于设备(5)的上游,该设备用于将光分配为两个分开的光束。在第一分割光束(21)中具有中间元件(9)以改变波长。第二分割光束(19)直接对准样品(41)以对第一区域进行光刺激。还包括具有显微镜透镜,检测器和光束偏转器装置的扫描显微镜的独立权利要求,所述光束偏转器装置用于将照明光束引导到样本上。

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