首页> 外国专利> Thermal analysis of large numbers of samples, such as pipette samples by varying heat supply to the sample in a controlled manner and thermographic analysis of temperature changes with high spatial and temperature resolution

Thermal analysis of large numbers of samples, such as pipette samples by varying heat supply to the sample in a controlled manner and thermographic analysis of temperature changes with high spatial and temperature resolution

机译:通过以受控方式改变对样品的供热,对大量样品(例如移液器样品)进行热分析,并以高空间和温度分辨率对温度变化进行热成像分析

摘要

Apparatus for simultaneous thermal analysis of a large number of material samples in which a sample field is placed on a dynamically controlled surface heater or arranged in the field of a radiation heater. Temperature changes in the sample field are analyzed using contact free image generating thermography. The sample field includes a calibration sample. Heater can be an electrical film heater with infrared emitting or absorbing coating of the surface of the heater or on the bottom of the sample tray or a radiative heater, which is used for vertical sample arrangements. A controller can be used with the heater to provide continuous, cyclic, gradually increasing or sudden increases in heating power.
机译:用于同时进行大量材料样品热分析的设备,其中样品区放置在动态控制的表面加热器上或布置在辐射加热器的区域中。使用无接触图像生成热像仪分析样品场中的温度变化。样品字段包括校准样品。加热器可以是电薄膜加热器,该加热器的表面或样品托盘底部或辐射加热器具有红外发射或吸收涂层,用于垂直样品布置。控制器可与加热器一起使用,以提供连续,周期性,逐渐增加或突然增加的加热功率。

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