首页> 外国专利> Dimensioning transistors in integrated circuits by re-dimensioning transistors in path with propagation time below target, based on propagation time probability distribution

Dimensioning transistors in integrated circuits by re-dimensioning transistors in path with propagation time below target, based on propagation time probability distribution

机译:根据传播时间概率分布,通过对传播时间低于目标的路径中的晶体管进行重新尺寸,确定集成电路中晶体管的尺寸

摘要

The method involves creating a circuit design for the integrated circuit comprising a number of paths, where a path includes a serial arrangement of transistor gates. The nominal propagation time of the paths are determined based on the initial dimensioning of the transistors of the paths. The method then involves determining at least one path to be optimized, whose nominal path propagation time lies below a target propagation time (Tziel). The transistors of the path to be optimized are re-dimensioned, taking account of a gate propagation time probability distribution and the number of transistor gates in the path.
机译:该方法涉及为包括许多路径的集成电路创建电路设计,其中路径包括晶体管栅极的串联布置。路径的标称传播时间是根据路径的晶体管的初始尺寸确定的。然后,该方法包括确定至少一条要优化的路径,该路径的标称路径传播时间低于目标传播时间(Tziel)。考虑到栅极传播时间概率分布和路径中晶体管栅极的数量,重新优化要优化路径的晶体管的尺寸。

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