Test circuit for testing synchronous memory circuit compares generated test data with data read from memory circuit, outputs display signal indicating whether memory circuit is functional

摘要

The test circuit (1) has a has a frequency multiplier circuit (4), a test data generator (16), a first signal delay circuit (19), a second signal delay circuit (24) and a data comparison circuit (27) that compares the generated test data with data read from the memory circuit (3) and depending on the result outputs a display signal to the external test device (2) indicating whether the memory circuit being tested is functional.