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Imaging, measuring at least part of surface of at least one three-dimensional object involves computing 3D information continuously using multiple acquisition units and self-calibration data

机译:成像,测量至少一个三维物体的至少一部分表面涉及使用多个采集单元和自校准数据连续计算3D信息

摘要

The method involves projecting a light pattern onto object or surface areas, using image acquisition units with the light pattern in their overlapping fields of view to simultaneously produce 2D image information from different positions and deriving 3D information. A computer unit computes 3D information continuously using self-calibration information. The relative positions of light source and object are varied to illuminate different areas. The method involves projecting a light pattern onto areas of the object or surface, using at least two image acquisition units with the light pattern in their overlapping fields of view, to produce two-dimensional image information from different positions and deriving three-dimensional information from the two-dimensional information. The illuminated areas are simultaneously observed by the units, the acquired information is fed to a computer unit, which computes three-dimensional information continuously using self-calibration information, and the relative positions of the light source and object are varied to illuminate different areas. AN Independent claim is also included for the following: an arrangement for conducting a measurement process for at least partial acquisition and measurement of a surface of at least one three-dimensional object or of optional surfaces.
机译:该方法涉及使用图像采集单元将光图案投影到对象或表面区域上,其中光图案在它们的重叠视场中,以同时从不同位置产生2D图像信息并得出3D信息。计算机单元使用自校准信息连续计算3D信息。改变光源和物体的相对位置以照亮不同的区域。该方法包括使用至少两个图像采集单元将光图案投影到对象或表面的区域上,其中光图案在其重叠的视场中,以从不同位置产生二维图像信息,并从中获得三维信息。二维信息。各单元同时观察照明区域,获取的信息被馈送到计算机单元,该计算机单元使用自校准信息连续计算三维信息,并且改变光源和物体的相对位置以照明不同区域。还包括以下权利要求:一种用于进行测量过程的装置,该测量过程用于至少部分地采集和测量至少一个三维物体的表面或可选表面。

著录项

  • 公开/公告号DE10149750A1

    专利类型

  • 公开/公告日2002-09-19

    原文格式PDF

  • 申请/专利权人 TECMATH AG;

    申请/专利号DE2001149750

  • 发明设计人 HANFELD HELMUT;HARVEN QUIDO;

    申请日2001-10-09

  • 分类号G01C11/30;G06K7/10;G01B11/24;G01C11/26;

  • 国家 DE

  • 入库时间 2022-08-22 00:26:51

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