首页> 外国专利> Lithography device using a source of radiation in the extreme ultraviolet and multilayer mirrors a wide spectral band in this field

Lithography device using a source of radiation in the extreme ultraviolet and multilayer mirrors a wide spectral band in this field

机译:使用极紫外辐射源的光刻设备和多层镜可在该场中反射宽光谱带

摘要

Lithography device using a source of radiation in the extreme ultraviolet range and multi-layered mirrors with a broad spectral band within this range. Each mirror (24, 26, 29) comprises a stack of layers of a first material and layers of a second material alternating with the first material. The first material has an atomic number greater than that of the second material. The thickness of pairs of adjacent layers is a monotonic function of the depth in the stack. The source (22) comprises at least one target (28) which emits the radiation by interaction with a laser beam focused on one of its faces. A part (36) of the radiation emitted from the other face is used. The invention is applicable to the manufacture of integrated circuits with a high degree of integration.
机译:使用极紫外范围内的辐射源和在该范围内具有较宽光谱带的多层反射镜的光刻设备。每个镜子(24、26、29)包括第一材料的层和与第一材料交替的第二材料的层的堆叠。第一材料的原子序数大于第二材料的原子序数。成对的相邻层的厚度是堆叠中深度的单调函数。源(22)包括至少一个靶(28),该靶通过与聚焦在其一个面上的激光束相互作用而发射辐射。使用从另一面发出的辐射的一部分(36)。本发明适用于高集成度的集成电路的制造。

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