Wireless device and method for calibrating a temperature sensor

摘要

A device and method for calibrating at least one temperature sensor is disclosed herein. A wafer (30) is provided having a first plurality of calibration elements or islands (36) of a material having a melting point in the range 150 DEG - 1150 DEG C. The effective reflectivity of the wafer is measured in operation using the temperature sensor or via a separate light source. A first step change in an output signal of the temperature sensor corresponding to a wafer temperature equal to the melting point of the first calibration islands is detected. Finally, the temperature sensor calibration parameters are calculated. Other devices, systems and methods are also disclosed. IMAGE