首页>
外国专利>
And method of three-dimensional inspection equipment of electronic components
And method of three-dimensional inspection equipment of electronic components
展开▼
机译:电子元器件三维检测设备及方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
An apparatus for three dimensional inspection of an electronic part (1040) which has a camera (1008) and illuminator (1017) for imaging a first view (1046) of the electronic part (1040). An optical element (1002) is positioned to reflect a different view (1048) of the electronic part (1040) into the camera (1008), and the camera (1008) thus provides an image (1044) of the electronic part having differing views of the electronic part (1040). An image processor (13) applies calculations on the differing views to calculate a three dimensional position of at least one portion of the electronic part.
展开▼