Random Vibration Analysis of Electronic Equipment Based on the Substructure Method

摘要

To improve the computational efficiency in large-scale problems,the substructure method was proposed in the finite element analysis(FEA)of constructions,electronics devices,auto parts,etc.The effect of random vibration on an electronic chassis was analyzed by the substructure method via the ANSYS FEA.The basic principles of the substructure methods were briefly discussed,and then modeling and FEA,including model analysis and power spectral density(PSD)analysis,of the electronic chassis was conducted with substructure method via the ANSYS.Finally vibration experiment was done to verify the accuracy of FEA with substructure method,which proved that the substructure method,with adequate accuracy,could improve the computational efficiency for large-scale electronic chassis.Based on the stress distribution from FEA and experimental results,a comprehensive structural optimization was proposed.