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ABRASION LOSS MEASUREMENT METHOD AND MEASUREMENT DEVICE

机译:磨耗损失的测定方法及测定装置

摘要

PROBLEM TO BE SOLVED: To provide a means capable of exactly obtaining small abrasion of nano-meter size in a protection film on a sliding member surface.;SOLUTION: In the measurement method for abrasion loss of a measurement sample surface having a substrate and a coating layer, a standard sample surface spectrum is formed by using a surface element analyzer analyzing element of a material surface from charged particle energy spectrum obtained by measuring charged particles generated out of the material surface when excited ionization radiation is irradiated to a sample identical to the measurement sample. With this spectrum, a process for obtaining a signal intensity ratio of a plurality of elements is performed for a plurality of times, etching the standard sample surface in parallel, and a calibration curve indicating the distribution of the signal intensity ratio of a plurality of elements in the standard sample. Then the charged particle energy spectrum on the measurement sample surface is measured, the signal intensity ratio is calculated and referred to the calibration curve and the abrasion loss of the measurement sample is determined.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种能够在滑动部件表面的保护膜中准确地获得纳米级小磨损的方法。解决方案:在具有衬底和金属的测量样品表面的磨损损失的测量方法中。涂层,通过使用表面元素分析仪分析材料表面的元素,从带电粒子能谱中形成标准样品表面光谱,该带电粒子能谱是通过测量当激发电离辐射照射到与样品相同的样品时从材料表面产生的带电粒子而获得的测量样本。利用该光谱,多次执行获得多个元素的信号强度比的过程,平行蚀刻标准样品表面,并显示表示多个元素的信号强度比的分布的校准曲线。在标准样品中。然后测量测量样品表面上的带电粒子能谱,计算信号强度比并参考校准曲线,确定测量样品的磨损量。版权所有:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2003307414A

    专利类型

  • 公开/公告日2003-10-31

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20020111785

  • 发明设计人 YOSHIKI MASAHIKO;KATO MAKOTO;

    申请日2002-04-15

  • 分类号G01B15/00;G01N23/227;

  • 国家 JP

  • 入库时间 2022-08-22 00:18:02

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