首页> 外国专利> INSTRUMENT AND METHOD FOR MEASURING REFLECTIVITY FOR DETERMINING REFLECTIVITY IN SELECTED MEASURING PORTION OF SPECTRUM-DEPENDENT REFLECTIVE MEASURING OBJECT

INSTRUMENT AND METHOD FOR MEASURING REFLECTIVITY FOR DETERMINING REFLECTIVITY IN SELECTED MEASURING PORTION OF SPECTRUM-DEPENDENT REFLECTIVE MEASURING OBJECT

机译:测定反射率的仪器和方法,用于确定光谱相关反射测量对象的选定测量部分中的反射率

摘要

PROBLEM TO BE SOLVED: To provide a reflectivity measuring instrument and a method therefor reduced in a measuring time for a measuring object by stable and simple measuring constitution, capable of using a compact radiation source of low power compared with a cyclotron to characterize the measuring object in a manufacturing site or a using site, and suitable for mass-production. SOLUTION: A reflection element 3 with a spectral target reflection characteristic is arranged in a downstream of the radiation source 1 to modulate a measurement radiation beam 2 inside a radiation passage. The reflection element 3 orients the modulated radiation beam 4 to the measuring object 5. A receiver for receiving a radiation reflected by a selected measuring portion is constituted as an integrating measurement detector 8.
机译:解决的问题:提供一种反射率测量仪器及其方法,其通过稳定且简单的测量构造来减少测量对象的测量时间,与回旋加速器相比,能够使用紧凑的低功率辐射源来表征测量对象在生产现场或使用现场,并且适合批量生产。解决方案:具有光谱目标反射特性的反射元件3布置在辐射源1的下游,以调制辐射通道内部的测量辐射束2。反射元件3将调制的辐射束4定向到测量对象5。用于接收被选择的测量部分反射的辐射的接收器构成为积分测量检测器8。

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