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INSTRUMENT AND METHOD FOR MEASURING REFLECTIVITY FOR DETERMINING REFLECTIVITY IN SELECTED MEASURING PORTION OF SPECTRUM-DEPENDENT REFLECTIVE MEASURING OBJECT
INSTRUMENT AND METHOD FOR MEASURING REFLECTIVITY FOR DETERMINING REFLECTIVITY IN SELECTED MEASURING PORTION OF SPECTRUM-DEPENDENT REFLECTIVE MEASURING OBJECT
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机译:测定反射率的仪器和方法,用于确定光谱相关反射测量对象的选定测量部分中的反射率
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摘要
PROBLEM TO BE SOLVED: To provide a reflectivity measuring instrument and a method therefor reduced in a measuring time for a measuring object by stable and simple measuring constitution, capable of using a compact radiation source of low power compared with a cyclotron to characterize the measuring object in a manufacturing site or a using site, and suitable for mass-production. SOLUTION: A reflection element 3 with a spectral target reflection characteristic is arranged in a downstream of the radiation source 1 to modulate a measurement radiation beam 2 inside a radiation passage. The reflection element 3 orients the modulated radiation beam 4 to the measuring object 5. A receiver for receiving a radiation reflected by a selected measuring portion is constituted as an integrating measurement detector 8.
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