首页> 外国专利> RESIST PATTERN USED FOR BUMP FORMATION BY DEPOSITION LIFT-OFF AND FORMATION METHOD THEREOF, BUMP AND FORMATION METHOD THEREOF AND ELASTIC SURFACE WAVE ELEMENT AND MANUFACTURING METHOD THEREOF

RESIST PATTERN USED FOR BUMP FORMATION BY DEPOSITION LIFT-OFF AND FORMATION METHOD THEREOF, BUMP AND FORMATION METHOD THEREOF AND ELASTIC SURFACE WAVE ELEMENT AND MANUFACTURING METHOD THEREOF

机译:用于沉积起落的凸起形成的抗蚀剂型及其形成方法,凸起和形成方法及其弹性表面波要素及其制造方法

摘要

PROBLEM TO BE SOLVED: To provide a resist pattern which enables formation of a bump of high adhesion by deposition lift-off.;SOLUTION: A peeling layer 12 which is in contact with an element substrate 2 and can be readily peeled off to the element substrate 2, and a main resist layer 13 which is formed on the peeling layer 12 and has stress resistance higher than the peeling layer 12, are comprised. The peeling layer 12 is constituted of thermoplastic resin such as polydimethylgluterimide, which hardly accelerates polymerization even if it is heated and subjected to light irradiation and has relatively weak resin bonding strength. The main resist layer 13 is constituted of a resin such as acrylic acid ester resin whose polymerization is high and resin bonding strength is high when compared to the thermoplastic resin consisting the peeling layer 12.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种抗蚀剂图案,该抗蚀剂图案能够通过沉积剥离形成高粘附力的凸点。解决方案:与元件基板2接触并且可以容易地剥离到元件上的剥离层12基板2包括:主抗蚀剂层13,该主抗蚀剂层13形成在剥离层12上并且具有比剥离层12高的耐应力性。剥离层12由诸如聚二甲基戊二酰亚胺的热塑性树脂构成,即使被加热并受到光照射也难以加速聚合并且树脂结合强度相对较弱。主抗蚀剂层13由诸如丙烯酸酯树脂之类的树脂构成,与构成剥离层12的热塑性树脂相比,该树脂的聚合度高并且树脂结合强度高; COPYRIGHT:(C)2004,JPO

著录项

  • 公开/公告号JP2003318212A

    专利类型

  • 公开/公告日2003-11-07

    原文格式PDF

  • 申请/专利权人 MURATA MFG CO LTD;

    申请/专利号JP20020125699

  • 发明设计人 IWAMOTO TAKASHI;TOSE MASATO;IWATA KEIJI;

    申请日2002-04-26

  • 分类号H01L21/60;H03H3/08;H03H9/145;

  • 国家 JP

  • 入库时间 2022-08-22 00:15:18

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号