首页> 外国专利> ALIGNMENT MATCHING METHOD OF MICROSCOPE AND MICROSCOPE HAVING ALIGNMENT MATCHING DEVICE OF LIGHT BEAM

ALIGNMENT MATCHING METHOD OF MICROSCOPE AND MICROSCOPE HAVING ALIGNMENT MATCHING DEVICE OF LIGHT BEAM

机译:显微镜的对准匹配方法及具有光束对准匹配装置的显微镜

摘要

PROBLEM TO BE SOLVED: To provide a method capable of easily regulating a beam path within an optical system.;SOLUTION: The light beam (1) of the microscope (15) is inputted and coupled to a regulating device (7) of the light beam (1) at a prescribed position and at this time the inputted and coupled light beam (9) is formed within the device (70). The inputted and coupled light beam (9) is deflected to at least two photodetectors (10 and 22). The photodetectors (10 and 22) respectively have the different distances from the prescribed positions and the deviation between the inputted and coupled light beam (9) and a target position (72) is detected from the electric signals of the photodetectors (10 and 20) and an optical component (76) is regulated to bring the inputted and coupled light beam (9) to the target position (72) across at least one regulating element (78).;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种能够容易地调节光学系统内的光路的方法;解决方案:显微镜(15)的光束(1)输入并耦合到光的调节装置(7)光束(1)在指定位置,并且此时输入并耦合的光束(9)在设备(70)内形成。输入并耦合的光束(9)偏转到至少两个光电探测器(10和22)。光电探测器(10和22)分别距规定位置具有不同的距离,并且从光电探测器(10和20)的电信号中检测输入和耦合光束(9)与目标位置(72)之间的偏差。光学元件(76)被调节以使输入并耦合的光束(9)穿过至少一个调节元件(78)到达目标位置(72)。版权所有:(C)2003,JPO

著录项

  • 公开/公告号JP2002333580A

    专利类型

  • 公开/公告日2002-11-22

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS HEIDELBERG GMBH;

    申请/专利号JP20020067784

  • 发明设计人 BIRK HOLGER;ENGELHARDT JOHANN;

    申请日2002-03-13

  • 分类号G02B21/00;G02B7/00;G02B26/08;

  • 国家 JP

  • 入库时间 2022-08-22 00:15:13

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号