首页> 外国专利> CHARACTERISTICS ADJUSTMENT METHOD OF ELECTRON SOURCE AND MANUFACTURING METHOD OF ELECTRON SOURCE, AND CHARACTERISTICS ADJUSTMENT METHOD AND MANUFACTURING METHOD OF IMAGE DISPLAY DEVICE

CHARACTERISTICS ADJUSTMENT METHOD OF ELECTRON SOURCE AND MANUFACTURING METHOD OF ELECTRON SOURCE, AND CHARACTERISTICS ADJUSTMENT METHOD AND MANUFACTURING METHOD OF IMAGE DISPLAY DEVICE

机译:电子源的特性调整方法及电子源的制造方法,图像显示装置的特性调整方法及制造的方法

摘要

PROBLEM TO BE SOLVED: To reduce variation of the electron emission characteristics of the electron emitting element and display characteristics of the display element easily and in a short time and improve the image quality.;SOLUTION: The emitting current of the surface conducting emitting element at the time of pressing of drive current is measured (S1-4), and by performing a one-dimensional or two-dimensional filter treatment to the measured value, characteristics objective values are established (S8-9). By impressing a characteristics shift voltage having a voltage or an impressing time that corresponds to the initial characteristics of each element, the characteristics is shifted so that the electron emission characteristics may realize the characteristics objective values.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:容易且在短时间内减少电子发射元件的电子发射特性的变化和显示元件的显示特性,并提高图像质量。解决方案:表面导电发射元件的发射电流为测量驱动电流的按压时间(S1-4),并对测量值进行一维或二维滤波处理,从而建立特性目标值(S8-9)。通过施加具有与每个元件的初始特性相对应的电压或施加时间的特性偏移电压,特性被偏移,使得电子发射特性可以实现特性目标值。;版权所有:(C)2003,JPO

著录项

  • 公开/公告号JP2003123650A

    专利类型

  • 公开/公告日2003-04-25

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20020029756

  • 申请日2002-02-06

  • 分类号H01J9/44;H01J9/02;H01J9/42;

  • 国家 JP

  • 入库时间 2022-08-22 00:14:20

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