首页>
外国专利>
CHARACTERISTICS ADJUSTMENT METHOD OF ELECTRON SOURCE AND MANUFACTURING METHOD OF ELECTRON SOURCE, AND CHARACTERISTICS ADJUSTMENT METHOD AND MANUFACTURING METHOD OF IMAGE DISPLAY DEVICE
CHARACTERISTICS ADJUSTMENT METHOD OF ELECTRON SOURCE AND MANUFACTURING METHOD OF ELECTRON SOURCE, AND CHARACTERISTICS ADJUSTMENT METHOD AND MANUFACTURING METHOD OF IMAGE DISPLAY DEVICE
展开▼
机译:电子源的特性调整方法及电子源的制造方法,图像显示装置的特性调整方法及制造的方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To reduce variation of the electron emission characteristics of the electron emitting element and display characteristics of the display element easily and in a short time and improve the image quality.;SOLUTION: The emitting current of the surface conducting emitting element at the time of pressing of drive current is measured (S1-4), and by performing a one-dimensional or two-dimensional filter treatment to the measured value, characteristics objective values are established (S8-9). By impressing a characteristics shift voltage having a voltage or an impressing time that corresponds to the initial characteristics of each element, the characteristics is shifted so that the electron emission characteristics may realize the characteristics objective values.;COPYRIGHT: (C)2003,JPO
展开▼