Method for producing a characteristic adjustment method and the image display device manufacturing method and the image display device characteristic adjustment method and an electron source of the electron source

摘要

PROBLEM TO BE SOLVED: To reduce variation of the electron emission characteristics of the electron emitting element and display characteristics of the display element easily and in a short time and improve the image quality.;SOLUTION: The emitting current of the surface conducting emitting element at the time of pressing of drive current is measured (S1-4), and by performing a one-dimensional or two-dimensional filter treatment to the measured value, characteristics objective values are established (S8-9). By impressing a characteristics shift voltage having a voltage or an impressing time that corresponds to the initial characteristics of each element, the characteristics is shifted so that the electron emission characteristics may realize the characteristics objective values.;COPYRIGHT: (C)2003,JPO