首页> 外国专利> RETICLE, AND RETICLE MANUFACTURING APPARATUS, RETICLE INSPECTING APPARATUS, AND RETICLE STORAGE CONTAINER AND EXPOSURE DEVICE

RETICLE, AND RETICLE MANUFACTURING APPARATUS, RETICLE INSPECTING APPARATUS, AND RETICLE STORAGE CONTAINER AND EXPOSURE DEVICE

机译:标线和标线制造设备,标线检查设备以及标线存储容器和曝光设备

摘要

PROBLEM TO BE SOLVED: To provide a reticle structure to prevent the infiltration of impurities including oxygen and moisture into a pellicle space of a reticle and to provide manufacturing means, storing means, inspecting means and exposing means for the same.;SOLUTION: In a manufacturing stage of the reticle, inert gas is sealed under the pressure higher than ambient pressure into the pellicle space and the reticle is stored in a pressure vessel so as to maintain this state. In inspecting the reticle, the reticle is inspected by adjusting the air pressure of an inspection space based on the pressure of the pellicle. In the exposure device, the reticle is exposed by adjusting the air pressure in the exposure space during exposure based on the pressure of the pellicle.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种掩模版结构,以防止包括氧气和水分的杂质渗入掩模版的表膜薄膜空间,并提供制造装置,存储装置,检查装置和曝光装置;解决方案:在光罩的制造阶段,将惰性气体在高于环境压力的压力下密封到光罩膜空间中,并且将光罩存储在压力容器中以保持该状态。在对掩模版进行检查时,通过基于防护膜的压力来调整检查空间的气压来对掩模版进行检查。在曝光装置中,通过基于薄膜的压力来调节曝光期间的曝光空间中的气压来使掩模版曝光。COPYRIGHT:(C)2003,JPO

著录项

  • 公开/公告号JP2003222991A

    专利类型

  • 公开/公告日2003-08-08

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20020020274

  • 发明设计人 HASEGAWA TAKAYASU;TERAJIMA SHIGERU;

    申请日2002-01-29

  • 分类号G03F1/14;G03F7/20;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-22 00:14:06

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