首页> 外国专利> CRACK-INSPECTING METHOD AND DEVICE FOR CATHODE-RAY TUBE, AND METHOD AND DEVICE FOR MANUFACTURING THE CATHODE- RAY TUBE

CRACK-INSPECTING METHOD AND DEVICE FOR CATHODE-RAY TUBE, AND METHOD AND DEVICE FOR MANUFACTURING THE CATHODE- RAY TUBE

机译:阴极射线管的裂纹探伤方法和装置,以及制造阴极射线管的方法和装置

摘要

PROBLEM TO BE SOLVED: To provide a crack inspecting method for a cathode-ray tube, capable of automatically and surely inspecting the crack on a panel 12 of the cathode- ray tube corresponding to the state of cracking. SOLUTION: A face surface 12a and a side surface 12b of the panel 12 of the cathode-ray tube are respectively illuminated to photograph their images, and the crack on the panel 12 is specified on the basis of the photographed images of the face surface 12a and the side surfaces 12b. Both of the crack made from the side surface 12b to the face surface 12a of the panel 12, and the cracks made along the circumferential direction of the panel along the side surface 12b can be specified. That is, the crack on the panel 12 can be inspected automatically and surely corresponding to the state of cracking.
机译:要解决的问题:提供一种用于阴极射线管的裂纹检查方法,该方法能够根据裂纹的状态自动且可靠地检查阴极射线管的面板12上的裂纹。解决方案:分别照亮阴极射线管面板12的正面12a和侧面12b以拍摄其图像,并根据所拍摄的正面12a的图像指定面板12上的裂纹。侧面12b。可以指定从面板12的侧面12b至端面12a形成的裂纹和沿着面板的周向沿着侧面12b形成的裂纹。即,面板12上的裂纹可以根据裂纹的状态自动且可靠地检查。

著录项

  • 公开/公告号JP2002343253A

    专利类型

  • 公开/公告日2002-11-29

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20010140580

  • 发明设计人 SARUHASHI YASUO;SHIDARA KATSUJI;

    申请日2001-05-10

  • 分类号H01J9/42;G06T1/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:13:17

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