首页> 外国专利> SAMPLE HOLDER AND PROCESSING METHOD OF RESONANCE ELEMENT EMPLOYING THE SAMPLE HOLDER, AND RESONANCE CHARACTERISTIC ADJUSTMENT METHOD FOR THE RESONANCE ELEMENT

SAMPLE HOLDER AND PROCESSING METHOD OF RESONANCE ELEMENT EMPLOYING THE SAMPLE HOLDER, AND RESONANCE CHARACTERISTIC ADJUSTMENT METHOD FOR THE RESONANCE ELEMENT

机译:使用样本保持器的样本保持器和共振元件的处理方法,以及共振元件的共振特征调整方法

摘要

PROBLEM TO BE SOLVED: To provide a resonance element with a required resonance characteristic (Qu: Q at no load) with excellent yield.;SOLUTION: A sample holder 32 of a measurement device 31 for measuring the resonance characteristic of a resonance element 21 made of a single crystal sphere of a ferrimagnetic body is formed tubular and structured to locate the resonance element 21 in its inside, and the tubular part 33 is provided with an intake port 34 and an exhausting port 35 for blast processing air. Since blast processing is applied to the resonance element 21 to obtain a required Qu value by surface scratching processing while the resonance element 21 is held in the sample holder 32, the processing of the resonance element 21 is progressed while the Qu is measured.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:为了提供一种具有优良成品率的所需共振特性(无负载下的Qu:Q)的共振元件;解决方案:制造用于测量共振元件21的共振特性的测量装置31的样品架32。铁磁性体的单晶球的一部分形成为管状并且构造成将共振元件21定位​​在其内部,并且管状部分33设置有用于对空气进行鼓风处理的进气口34和排气口35。由于在将共振元件21保持在样本保持器32中的同时通过表面刮擦处理对共振元件21进行了喷砂处理以获得所需的Qu值,因此在测量Qu的同时进行了共振元件21的处理。 :(C)2003,日本特许厅

著录项

  • 公开/公告号JP2003032014A

    专利类型

  • 公开/公告日2003-01-31

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP;

    申请/专利号JP20010218060

  • 发明设计人 HORI HISAO;

    申请日2001-07-18

  • 分类号H01P7/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:12:55

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