首页> 外国专利> Method of manufacturing crystal of III-V compounds of the nitride system, crystal substrate of III-V compounds of the nitride system, crystal film of III-V compounds of the nitride system, and method of manufacturing device

Method of manufacturing crystal of III-V compounds of the nitride system, crystal substrate of III-V compounds of the nitride system, crystal film of III-V compounds of the nitride system, and method of manufacturing device

机译:氮化物系的III-V族化合物的结晶的制造方法,氮化物系的III-V族化合物的结晶基板,氮化物系的III-V族化合物的结晶膜以及制造装置

摘要

A base crystal layer is formed on the surface of a basal body by growing, e.g., GaN comprising a III-Vcompound by MOCVD and then the base crystal layer 12 is etched. An intermediate crystal layer is formed by laterally growing GaN from windows formed in the base crystal layer by etching. In the intermediate crystal layer, an inner layer made of, e.g., AlGaN is formed. Then, the intermediate crystal layer is further etched and a top crystal layer is formed by laterally growing GaN from windows formed in the intermediate crystal layer by etching. An inner layer made of, e.g., AlGaN is formed in the top crystal layer. Development of dislocations is suppressed to some extent by the lateral growth when forming the intermediate crystal layer and the top crystal layer. Further, development of dislocations is suppressed by the inner layers.
机译:通过例如通过MOCVD生长包括III-V族化合物的GaN,在基体的表面上形成基础晶体层,然后蚀刻基础晶体层 12 。通过通过蚀刻从形成在基础晶体层中的窗口横向生长GaN来形成中间晶体层。在中间晶体层中,形成由例如AlGaN制成的内层。然后,进一步蚀刻中间晶体层,并通过蚀刻从形成在中间晶体层中的窗口横向生长GaN来形成顶层晶体层。在顶部晶体层中形成由例如AlGaN制成的内层。当形成中间晶体层和顶部晶体层时,通过横向生长在一定程度上抑制了位错的发展。此外,内层抑制了位错的发展。

著录项

  • 公开/公告号US2003073315A1

    专利类型

  • 公开/公告日2003-04-17

    原文格式PDF

  • 申请/专利权人 MORITA ETSUO;

    申请/专利号US20020290570

  • 发明设计人 ETSUO MORITA;

    申请日2002-11-08

  • 分类号H01L21/00;H01L21/302;H01L21/461;

  • 国家 US

  • 入库时间 2022-08-22 00:11:21

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