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Conductivity testing method for a sub-harness and a sub-harness manufacturing apparatus

机译:副线束的导电性测试方法及副线束的制造装置

摘要

A conductivity testing method for a sub-harness and a sub-harness manufacturing apparatus are provided, which sub-harness manufacturing apparatus includes: a pair of connecting units each having a wire connecting portion, made of metal, vertically movable so as to connect one end of one or wires composing a sub-harness to one of terminals having a sheathing clamping portion and being arranged in a wire feeding direction; and a pair of transferring devices to transfer the terminals in a direction perpendicular to the wire feeding direction so as to position each one of the terminals under each wire connecting portions, wherein a clamping punch portion to clamp the sheathing clamping portion is provided on the wire connecting portion of each of the pair of connecting units and a conductivity testing device to judge the one, having terminals on the respective ends thereof, of the wires being good or bad is arranged between the clamping punch portions of the pair of connecting units.
机译:提供了一种用于副线束的导电性测试方法和副线束制造装置,该副线束制造装置包括:一对连接单元,每个连接单元具有金属制的金属线连接部,可上下移动以连接一个构成子线束的一根或多根线的末端,所述多根线束的其中一个端子具有护套夹持部分,并沿电线进给方向布置;一对传送装置,用于在垂直于送丝方向的方向上传送端子,以将每个端子定位在每个电线连接部分的下方,其中,在电线上设置有用于夹紧护套夹紧部分的夹紧冲头部分。一对连接单元中的每一个的连接部分和用于在一对连接单元的夹持冲头部分之间布置导电性测试装置,该导电性测试装置在其各自的端部上具有端子的优劣。

著录项

  • 公开/公告号US2003057960A1

    专利类型

  • 公开/公告日2003-03-27

    原文格式PDF

  • 申请/专利权人 YAZAKI CORPORATION;

    申请/专利号US20020265774

  • 发明设计人 KAZUHIKO TAKADA;

    申请日2002-10-08

  • 分类号H04B3/46;H01H31/02;

  • 国家 US

  • 入库时间 2022-08-22 00:11:02

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