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Fabrication, performance testing, and screening of three dimensional arrays of materials

机译:材料的三维阵列的制造,性能测试和筛选

摘要

The present invention relates to methods for the fabrication, performance testing and screening of combinatorial libraries of materials arranged as three dimensional arrays. The invention describes the generation and screening of three dimensional arrays by depositing a plurality of samples onto at least one substrate at discrete and defined positions in a three dimensional format such that each sample is isolated by the substrate from the other samples, and wherein each sample is defined by its (x, y, and z) coordinate, collecting analytical data from the sample array, correlating the analytical data collected from the array to the position of samples within the array, and analyzing the analytical data for a parameter of interest. The array may be performance tested for stability to chemical degradation, environmental stress, or other factors. Also described is the use of techniques such as confocal and multi-photon microscopy for the measurement and analysis of samples in the array.
机译:本发明涉及用于制造,性能测试和筛选布置成三维阵列的材料的组合库的方法。本发明描述了三维阵列的产生和筛选,该三维阵列是通过将多个样品以三维格式在离散的和限定的位置上沉积到至少一个基板上的至少一个基板上,使得每个基板被基板与其他样品隔离的方法,其中由其(x,y和z)坐标定义,从样品阵列收集分析数据,将从阵列收集的分析数据与样品在阵列中的位置相关联,并分析分析数据中的目标参数。可以对该阵列进行性能测试,以测试其对化学降解,环境压力或其他因素的稳定性。还介绍了使用诸如共聚焦和多光子显微镜技术对阵列中的样品进行测量和分析。

著录项

  • 公开/公告号US2003162179A1

    专利类型

  • 公开/公告日2003-08-28

    原文格式PDF

  • 申请/专利权人 GENERAL ELECTRIC COMPANY;

    申请/专利号US20020083727

  • 申请日2002-02-27

  • 分类号C12Q1/68;B05D3/00;G01N33/53;G06F19/00;G01N33/48;G01N33/50;C12M1/34;

  • 国家 US

  • 入库时间 2022-08-22 00:09:07

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