Tester accuracy using multiple passes

摘要

A test circuit generally comprising a tester connected to a socket for holding a device under test. The device may be configured to have (i) a first function and (ii) a final function. The tester may be configured to (i) stimulate the first function with a test signal to present a first output signal, (ii) stimulate the final function with the first output signal to present a final output signal; (iii) measure a result between the test signal and the final output signal, and (iv) allocate the result between the first function and the final function to disperse a measurement error in the result.