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JFET structure and manufacture method for low on-resistance and low voltage application

机译:用于低导通电阻和低压应用的jFET结构和制造方法

摘要

This invention discloses the present invention discloses a junction field effect transistor (JFET) device supported on a substrate. The JFET device includes a gate surrounded by a depletion region. As the distance between the gates is large enough, there is a gap between the depletion regions surrounding adjacent gates. Depletion mode JFET transistor which is normally on is provided. The normally on transistors respond to negative bias applied to the gates to shut of the current path in the substrate. The current path in the substrate is normally available with a zero gate bias. As the distance between the gates is reduced, the JFET transistor is normally off because the depletion regions surround the gates shut of the current channel. The depletion region responding to a positive bias applied to the gate to open a current path in the substrate wherein the current path in the substrate is shut off when the gate is zero biased. The normally on and normally off JFET transistors are configured to achieve low voltage drop, low on resistance, high current density and high frequency operations.
机译:本发明公开了本发明,公开了一种支撑在基板上的结型场效应晶体管(JFET)器件。 JFET器件包括被耗尽区包围的栅极。当栅极之间的距离足够大时,在围绕相邻栅极的耗尽区之间存在间隙。提供了通常处于导通状态的耗尽型JFET晶体管。常开晶体管对施加到栅极的负偏压作出响应,以关闭衬底中的电流路径。基板中的电流路径通常具有零栅极偏置。随着栅极之间的距离减小,JFET晶体管通常处于截止状态,因为耗尽区围绕着电流通道的栅极关闭。耗尽区响应于施加到栅极的正偏压以打开衬底中的电流路径,其中当栅极被零偏置时衬底中的电流路径被切断。常开和常关JFET晶体管配置为实现低电压降,低导通电阻,高电流密度和高频操作。

著录项

  • 公开/公告号US6486011B1

    专利类型

  • 公开/公告日2002-11-26

    原文格式PDF

  • 申请/专利权人 LOVOLTECH INC.;

    申请/专利号US20000690703

  • 发明设计人 HO-YUAN YU;

    申请日2000-10-16

  • 分类号H01L213/37;

  • 国家 US

  • 入库时间 2022-08-22 00:05:48

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