首页> 外国专利> Master cathode ray tube jig with LEDs simulating stray emissions for calibration of a stray emissions detection system and methods of making and using same

Master cathode ray tube jig with LEDs simulating stray emissions for calibration of a stray emissions detection system and methods of making and using same

机译:用于模拟杂散发射检测系统的带有模拟杂散发射的LED的主阴极射线管夹具及其制造和使用方法

摘要

A jig is used in place of a master Cathode Ray Tube (“CRT”) for calibrating a Stray Emissions Detection System (“SEDS”). Light Emitting Diodes (“LEDs”) are placed in the neck portion of a CRT, where the electron gun would normally be disposed, to form the test jig. These LEDs are activated during the calibration process to simulate the stray emissions that would be released through defects in a CRT. Because the number, pattern and light output of the LEDs can be controlled, and are not changed by the calibration procedure itself, the jig can be used to more reliably and effectively calibrate the SEDS for CRT manufacture.
机译:用夹具代替主阴极射线管(“ CRT”)来校准杂散发射检测系统(“ SEDS”)。发光二极管(“ LED”)被放置在CRT的颈部中,在该处通常将放置电子枪,以形成测试夹具。这些LED在校准过程中被激活,以模拟由于CRT中的缺陷而释放的杂散发射。由于可以控制LED的数量,样式和光输出,而无需通过校准程序本身进行更改,因此可以使用夹具更可靠,更有效地校准SEDS以进行CRT制造。

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