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Microelectronic fabrication die electrical probe apparatus electrical test method providing enhanced microelectronic fabrication die electrical test accuracy and efficiency
Microelectronic fabrication die electrical probe apparatus electrical test method providing enhanced microelectronic fabrication die electrical test accuracy and efficiency
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机译:微电子制造芯片电探针装置的电测试方法,提供增强的微电子制造芯片电测试的准确性和效率
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摘要
Within a method for electrical test testing a series of microelectronic fabrication die fabricated within a microelectronic frabrication substrate, there is first electrical probe tested the series of microelectronic fabrication die to determine at least one sub-series of electrically acceptable microelectronic fabrication die. Each electrically acceptable microelectronic fabrication die within the at least one sub-series of electrically acceptable microelectronic fabrication die is then electrical probe retested, but electrically unacceptable microelectronic fabrication die within corresponding sub-series of electrically unacceptable microelectronic fabrication die are not.
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