Device for measuring the reflection properties of a transparent substrate, especially glass, with a partially reflecting layer

摘要

In order to measure the reflection properties of a transparent substrate, especially glass (6), provided with a partially reflecting layer (7), a wheeled conveyor for the transparent substrates (6) is provided, on each side of the transparent substrate (6), with a rail (10, 11) overlapping the transparent substrate (6), on which can move a carriage (12, 13) carrying a measurement head (23, 27) for measuring the colour of the light reflected. The two measurement heads (23, 27) can be activated separately or together. From the carriage (12) carrying the measurement head (23) which points towards the layer (7) is mounted, at a distance (A) from the transparent substrate (6), and parallel thereto, an uncoated transparent substrate (24) which is situated in the path of the measurement ray of the measurement head (23). IMAGE