METHOD AND CIRCUIT FOR MEASURING A VOLTAGE OR A TEMPERATURE AND FOR GENERATING A VOLTAGE WITH ANY PREDETERMINABLE TEMPERATURE DEPENDENCE

摘要

There is adjustable temperature dependence for measuring to generate with the voltage of circuit and temperature and voltage the present invention relates to a kind of. The method of the present invention includes the steps of determining that the pn transition of the first forward voltage (U (I1, T)) of the first measured value (M1), by the first electric current (I1) flow, semiconductor element; It determines the identical nose point transformation of the second forward voltage (U (I2, T)) of the second measured value (M2), but is flowed by the second electric current (I2); Calculated value is proportional, the voltage (U0, U (I1, T, U (I2, T)), it measures from determining measured value (M1, M2), from at least one parameter, these characterization nose points change, and optionally from the dependence of desired temperature. Circuit of the invention includes A/D converter (tungsten), and semiconductor wafer (D types) has pn transition and voltage source, for providing the first and second electric current (I1; I2) change via nose point, thus pn transition is located at the input (W) with A/D converter. Computing circuit is connected to the output of A/D converter.