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SEMICONDUCTOR DEVICE HAVING TEMPERATURE DETECTING FUNCTION TESTING METHOD AND REFRESH CONTROL METHOD OF SEMICONDUCTOR STORAGE DEVICE HAVING TEMPERATURE DETECTING FUNCTION
SEMICONDUCTOR DEVICE HAVING TEMPERATURE DETECTING FUNCTION TESTING METHOD AND REFRESH CONTROL METHOD OF SEMICONDUCTOR STORAGE DEVICE HAVING TEMPERATURE DETECTING FUNCTION
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机译:具有温度检测功能的半导体装置的温度检测功能及刷新控制方法
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摘要
PURPOSE: To provide a semiconductor device provided with temperature detection function detecting the prescribed temperature with less dispersion and optimizing an operation state in accordance with the detected prescribed temperature, a test method, and a refresh-control method. CONSTITUTION: This device is provided with a memory cell 26, a refresh-control circuit 25 switching refresh-period tREF, and a temperature detecting section 12A biased by bias voltage VB+ from a voltage bias section 11 provided with a reference section 13 and a regulator section 14. Control of the refresh-control circuit 25 is switched by detection of the prescribed temperature tx0 by the temperature detecting section 12A, current consumption IDD in a low temperature region can be reduced keeping a data holding characteristic of the memory cell 26 in whole temperature range by performing refresh-operation with a short period in a high temperature region, with a long period in a low temperature region.
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