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Test bodies for use in testing optoelectronic image analysis systems that are used in automatic testing of the degree of loading of cleaning filters, whereby the bodies can be used to simulate an automatic measurement cycle
Test bodies for use in testing optoelectronic image analysis systems that are used in automatic testing of the degree of loading of cleaning filters, whereby the bodies can be used to simulate an automatic measurement cycle
Test body (1) for optoelectronic image analysis has a base body (2) on which a number of geometric structures (3) of different shape and size are fixed in a permanent manner. The structures stand out optically from the base body and do not overlap. An Independent claim is made for a method for manufacturing a test body in which a thin opaque layer is attached to a base body, particularly a metallic layer by steam deposition. The layer only remains where the geometrical structures wire originally marked.
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