Diagnosis method for the dielectric aging of multiple material dielectrics, by execution of in-situ loss factor measurements with frequencies much lower than those of the mains power supply allowing overall aging assessment

摘要

Method for diagnosis of the dielectric aging of multiple material dielectrics, by execution of in-situ loss factor measurements with frequencies lower than those of the mains power supply. The method can be applied to transformers, inductors, capacitors and cables. The invention also relates to a corresponding measurement system for delivery of low test voltages with a frequency of the order of 0.1 Hz in comparison with a supply frequency of 50 Hz.