首页> 外国专利> Photoresist for lithographic techniques, e.g. structuring silicon wafers, comprises a solution of organopolysiloxane with carbon side chains containing acid-labile groups attached to highly polar groups

Photoresist for lithographic techniques, e.g. structuring silicon wafers, comprises a solution of organopolysiloxane with carbon side chains containing acid-labile groups attached to highly polar groups

机译:用于光刻技术的光刻胶,例如结构化的硅片,包括有机聚硅氧烷溶液,其碳侧链包含连接至高极性基团的酸不稳定基团

摘要

A photoresist containing polymer, photo-acid former and solvent, in which the polymer chain has at least two parts, one based on alternating silicon and oxygen atoms and the other on carbon atoms, the latter containing acid-labile groups attached to highly polar groups so that the polymer is soluble in aqueous alkaline developers after cleavage of acid-labile groups.
机译:包含聚合物,光酸形成剂和溶剂的光致抗蚀剂,其中聚合物链具有至少两个部分,一个基于交替的硅和氧原子,另一个基于碳原子,后者包含与高极性基团相连的酸不稳定基团因此,在酸不稳定基团裂解后,聚合物可溶于碱性水溶液中。

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