首页> 外国专利> Electronic testing procedure for memory modules, such as dual in-line modules (DIMMs), requires making electronic comparison between number of modules and number of module identifiers

Electronic testing procedure for memory modules, such as dual in-line modules (DIMMs), requires making electronic comparison between number of modules and number of module identifiers

机译:内存模块(例如双列直插式模块(DIMM))的电子测试程序要求在模块数量和模块标识符数量之间进行电子比较

摘要

A method for electronically testing at least one memory module involves initially connecting the module to be tested to the computer system, electronically reading-in computer system configuration data, and then inputting a memory-module identifier for each memory module connected to the computer. An electronic comparison is made between the number of modules connected to the computer system and the number of memory module identifiers. Test information for the module being tested is then read in, followed by electronic testing of the module and the test results are automatically evaluated. If at least one module is faulty the erroneous data is electronically stored in at least one statistics data file. An Independent claim is given for a computer program product, as well as a computer program, for carrying out the electronic testing procedure.
机译:一种用于电子测试至少一个存储模块的方法,该方法包括首先将要测试的模块连接到计算机系统,以电子方式读取计算机系统配置数据,然后为连接到计算机的每个存储模块输入一个存储模块标识符。在连接到计算机系统的模块数量与内存模块标识符数量之间进行电子比较。然后读取被测模块的测试信息,然后对该模块进行电子测试,并自动评估测试结果。如果至少一个模块有故障,则将错误数据电子存储在至少一个统计数据文件中。对于用于执行电子测试程序的计算机程序产品以及计算机程序,具有独立权利要求。

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