首页> 外国专利> Isolation method for semiconductor devices used in microelectronics comprises a first switch, a second switch and a screen consisting of metal screening element for screening impurity signals between the two switches

Isolation method for semiconductor devices used in microelectronics comprises a first switch, a second switch and a screen consisting of metal screening element for screening impurity signals between the two switches

机译:用于微电子学中的半导体器件的隔离方法包括第一开关,第二开关和由金属屏蔽元件组成的屏蔽,用于屏蔽两个开关之间的杂质信号

摘要

Semiconductor device comprises a first switch (3), a second switch (5) and a screen for screening impurity signals between the two switches. The screen comprises a screening element (7) made from a metal. An Independent claim is also included for a process for the production of the semiconductor device, comprising growing a silicon crystal in an inert protective atmosphere containing a carbon-containing gas, forming a substrate suitable for the production of semiconductor components, forming a recess in the substrate, filling the trench with an aluminum-containing metal filling, and producing a first switch and a second switch on different sides of the recess. Preferred Features: The screen element extends in the lateral direction and/or vertically. The screening element is formed as a grate.
机译:半导体器件包括第一开关(3),第二开关(5)以及用于屏蔽两个开关之间的杂质信号的屏幕。筛网包括由金属制成的筛网元件(7)。还包括关于半导体器件的制造方法的独立权利要求,包括:在包含含碳气体的惰性保护气氛中生长硅晶体;形成适合于制造半导体部件的衬底;在半导体器件中形成凹槽。衬底,用含铝金属填充物填充沟槽,并在凹槽的不同侧上产生第一开关和第二开关。优选特征:筛网元件在横向和/或垂直方向上延伸。筛选元件形成为炉rate。

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