Guide system to dock a test probe used for electronic elements, has a tapered pin that locates in a matching recess to give location

摘要

The guide pin (7) of a test probe is located of a mounting (10) that is free to float to achieve alignment. The mounting has a threaded hole (15) into which is located a threaded pin (11) that has a tapered end (12). As the pin is turned the tapered tip engages a matching taper recess (23) in the guide pin and so centres it.