首页> 外国专利> Wire bonder calibration method for semiconductor chips, involves setting controlling parameters of ultrasonic transducer corresponding to two different capillaries, to satisfy specific condition with respect to strength of capillaries

Wire bonder calibration method for semiconductor chips, involves setting controlling parameters of ultrasonic transducer corresponding to two different capillaries, to satisfy specific condition with respect to strength of capillaries

机译:用于半导体芯片的引线键合机校准方法,涉及设置与两个不同毛细管相对应的超声换能器的控制参数,以满足关于毛细管强度的特定条件。

摘要

The ultrasonic waves are applied to a capillary (10) clamped onto the tip of a horn (16), from an ultrasonic transducer (17). The controlling parameters (P1,P2) of the transducer with respect to two different capillaries, are set, such that a condition P2 = g(k1,k2)xP1, is satisfied, where g(k1,k2) is a predetermined function of the flexural strength values (k1,k2) of the two capillaries.
机译:超声波从超声换能器(17)施加到夹在喇叭(16)尖端上的毛细管(10)上。设置换能器相对于两个不同毛细管的控制参数(P1,P2),以便满足条件P2 = g(k1,k2)xP1,其中g(k1,k2)是的预定函数两个毛细管的抗弯强度值(k1,k2)。

著录项

  • 公开/公告号DE10301743A1

    专利类型

  • 公开/公告日2003-08-14

    原文格式PDF

  • 申请/专利权人 ESEC TRADING S.A. CHAM;

    申请/专利号DE2003101743

  • 发明设计人 MAYER MICHAEL;MELZER MARTIN;

    申请日2003-01-18

  • 分类号H01R43/02;H05K3/30;

  • 国家 DE

  • 入库时间 2022-08-21 23:41:50

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