首页> 外国专利> Illumination arrangement for use with a fluorescent non- destructive surface crack detection method, whereby a monochromatic light source and a suitable wavelength observation filter are used to improve detection sensitivity

Illumination arrangement for use with a fluorescent non- destructive surface crack detection method, whereby a monochromatic light source and a suitable wavelength observation filter are used to improve detection sensitivity

机译:用于荧光非破坏性表面裂纹检测方法的照明装置,其中使用单色光源和合适的波长观察滤光片以提高检测灵敏度

摘要

Illumination device for surface crack detection has a monochromatic or nearly monochromatic light source for illumination of a workpiece. The workpiece is observed through a filter that blocks out the wavelength of the illumination light and is transparent to light of wavelength corresponding to that of the fluorescing workpiece surface.
机译:用于表面裂纹检测的照明装置具有用于照明工件的单色或接近单色的光源。通过滤光镜观察工件,该滤光镜遮挡照明光的波长,并且对波长对应于发荧光的工件表面的波长的光透明。

著录项

  • 公开/公告号DE20307809U1

    专利类型

  • 公开/公告日2003-07-31

    原文格式PDF

  • 申请/专利权人 STOECKL LUDWIG;

    申请/专利号DE2003207809U

  • 发明设计人

    申请日2003-05-20

  • 分类号G01N21/88;

  • 国家 DE

  • 入库时间 2022-08-21 23:40:50

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