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High frequency electric signal sampling device for use in pulse metrology, has second sampling stage in series with first stage, second sample being representative of the first sample and having a lifetime greater than that of the first
High frequency electric signal sampling device for use in pulse metrology, has second sampling stage in series with first stage, second sample being representative of the first sample and having a lifetime greater than that of the first
Device comprises a first stage (A1, I1, C1), which is used to take a first signal sample at a first instant in time and one or more second stages (A2, I2, C2), in series with the first, for taking a second sample from the first sample at a second instant of time greater than the first, with the second sample being representative of the first sample and having a lifetime greater than that of the first sample. An Independent claim is also included for a sampling system.
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