首页> 外国专利> MECHANICAL-CHEMICAL POLISHING MACHINE FOR A MATERIAL WAFER AND ABRASIVE DISPENSING DEVICE EQUIPPED WITH SUCH A MACHINE

MECHANICAL-CHEMICAL POLISHING MACHINE FOR A MATERIAL WAFER AND ABRASIVE DISPENSING DEVICE EQUIPPED WITH SUCH A MACHINE

机译:用于机械晶圆的机械化学抛光机以及配备有这种机器的研磨分配装置

摘要

P The invention relates to a mechanical-chemical polishing machine for a wafer (P) of a material, this machine comprising a rotary polishing plate (1), a polishing head (4) comprising a non-rotating part (42) and a rotary part (40, 41) and means (5) for distributing an abrasive (A) to the surface of said polishing plate (1). This machine is remarkable in that the means (5) for distributing the abrasive (A) comprise a hollow ring (50) for distributing the abrasive, provided with means (51) for supplying the abrasive, with a plurality of abrasive distribution orifices distributed over its underside (502) and fixing means (420, 520, 52) making it integral with said non-rotating part (42) of the polishing head (4), this ring (50) being arranged around said rotating part (40, 41), in a plane substantially parallel to the plane of said polishing plate (1) but spaced therefrom. Application to wafer polishing s (P) of semiconductor material. / P
机译:本发明涉及一种用于材料的晶片(P)的机械化学抛光机,该机械包括旋转抛光板(1),包括非旋转部件(42)的抛光头(4)和旋转部分(40、41)和用于将磨料(A)分配到所述抛光板(1)表面的装置(5)。该机器的显着之处在于,用于分配磨料(A)的装置(5)包括用于分配磨料的中空环(50),其设有用于供应磨料的装置(51),在其上分布有多个磨料分配孔其下侧(502)和固定装置(420、520、52)使其与抛光头(4)的所述非旋转部分(42)成为一体,该环(50)围绕所述旋转部分(40、41)布置)在基本上平行于所述抛光板(1)的平面但与之间隔开的平面中。应用于半导体材料的晶圆抛光(P)。

著录项

  • 公开/公告号FR2838365A1

    专利类型

  • 公开/公告日2003-10-17

    原文格式PDF

  • 申请/专利权人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES;

    申请/专利号FR20020004494

  • 发明设计人 FREDERIC METRAL;

    申请日2002-04-11

  • 分类号B24B57/02;B24B37/04;H01L21/461;

  • 国家 FR

  • 入库时间 2022-08-21 23:37:41

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