首页> 外国专利> RESISTANCE COMPONENT MEASURING INSTRUMENT, REACTANCE COMPONENT MEASURING INSTRUMENT, IMPEDANCE MEASURING INSTRUMENT, METHOD OF MEASURING RESISTANCE COMPONENT, AND METHOD OF MEASURING REACTANCE COMPONENT

RESISTANCE COMPONENT MEASURING INSTRUMENT, REACTANCE COMPONENT MEASURING INSTRUMENT, IMPEDANCE MEASURING INSTRUMENT, METHOD OF MEASURING RESISTANCE COMPONENT, AND METHOD OF MEASURING REACTANCE COMPONENT

机译:电阻成分测定仪器,电抗成分测定仪器,阻抗测定仪器,电阻成分测定方法及电抗成分测定方法

摘要

PROBLEM TO BE SOLVED: To provide a method by which the resistance component of an objective section can be measured accurately.;SOLUTION: A resistance component measuring instrument measures the resistance component of the objective section which connects one conductor and the other conductor, both of which are provided in an object to be measured to each other. The measuring instrument has a contacting means, a measuring means, and a calculating means. The contacting means brings at least two probes into contact with the first-mentioned conductor section and, at the same time, at least two probes into contact with the other conductor. The measuring means measures the resistance component between each pair of a plurality of probe pairs constituted of at least four probes in total by energizing the probe pairs. The calculating means calculates the resistance component of the objective section from the measured values of the plurality of resistance components obtained by means of the measuring means.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:提供一种可以准确地测量目标部分的电阻分量的方法。解决方案:电阻分量测量仪测量连接一根导体和另一根导体的目标部分的电阻分量。它们被提供在彼此测量的对象中。该测量仪器具有接触装置,测量装置和计算装置。接触装置使至少两个探针与首先提及的导体部分接触,并且同时使至少两个探针与另一导体接触。测量装置通过激励探针对来测量总共由至少四个探针构成的多个探针对中的每对之间的电阻分量。计算装置根据通过测量装置获得的多个电阻分量的测量值来计算目标部分的电阻分量。COPYRIGHT:(C)2004,JPO&NCIPI

著录项

  • 公开/公告号JP2004233167A

    专利类型

  • 公开/公告日2004-08-19

    原文格式PDF

  • 申请/专利权人 TOYOTA MOTOR CORP;

    申请/专利号JP20030020981

  • 发明设计人 OSAWA TAKASHI;

    申请日2003-01-29

  • 分类号G01R27/02;

  • 国家 JP

  • 入库时间 2022-08-21 23:34:57

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