首页> 外国专利> OPTICAL SYSTEM FOR SIMULTANEOUSLY MEASURING ABSOLUTE REFLECTIVITY AND ABSOLUTE TRANSMISSIVITY

OPTICAL SYSTEM FOR SIMULTANEOUSLY MEASURING ABSOLUTE REFLECTIVITY AND ABSOLUTE TRANSMISSIVITY

机译:同时测量绝对反射率和绝对透射率的光学系统

摘要

PROBLEM TO BE SOLVED: To provide a symmetric-X-type optical system for simultaneously measuring the absolute reflectivity and absolute transmissivity of a matter for accurately determining the optical constants of the matter.;SOLUTION: At least four mirrors or more selected from among four concave mirrors CM1-CM4 and four auxiliary mirrors SM1-SM4 are combined with two beam switching mirrors RM1 and RM2. Then by making light incident onto a sample from its surface and back surface, it is possible to measure both the absolute reflectivity to surface incidence and back surface incidence and absolute transmissivity to surface incidence and back surface incidence.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种对称X型光学系统,用于同时测量物质的绝对反射率和绝对透射率,以准确确定物质的光学常数。解决方案:从四个反射镜中至少选择四个或四个以上的反射镜凹面镜CM1-CM4和四个辅助镜SM1-SM4与两个光束切换镜RM1和RM2结合在一起。然后,通过使光从其表面和背面入射到样品上,可以测量对表面入射和背面入射的绝对反射率以及对表面入射和背面入射的绝对透射率。;版权:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2004045062A

    专利类型

  • 公开/公告日2004-02-12

    原文格式PDF

  • 申请/专利号JP20020199496

  • 发明设计人 KAWATE ETSUO;

    申请日2002-07-09

  • 分类号G01N21/01;G01J3/12;G01J3/45;G01M11/00;G01M11/04;G01N21/47;G01N21/59;

  • 国家 JP

  • 入库时间 2022-08-21 23:33:31

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号