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METHOD AND DEVICE FOR DETECTING ABERRATION OF OPTICAL LENS, AND DIFFRACTION GRATING FOR SENSING ABERRATION

机译:检测光学透镜像差的方法和装置,以及用于感测像差的衍射光栅

摘要

PROBLEM TO BE SOLVED: To shorten a time for aberration detection down to 2/3 or less of the conventional time by enabling the detection of astigmatism without rotating a diffraction grating.;SOLUTION: A method for detecting aberration of an optical lens makes light emitted from a light source 2 incident on the optical lens, makes condensed light from the optical lens incident on a diffraction grating 20 having first grating grooves arranged at constant pitches and second grating grooves intersected with the first grating grooves and arranged at constant pitches, forms sharing interference fringes having a plurality of interference regions mutually making angles by light emitted from the diffraction grating 20, measures a phase of light intensity change at a point in the interference region of the sharing interference fringes, and detects the astigmatism without rotating the diffraction grating 20 by detecting aberration by the phase.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:通过在不旋转衍射光栅的情况下能够进行像散检测,将像差检测时间缩短到传统时间的2/3或更短;解决方案:一种用于检测光学透镜像差的方法使光出射来自光源2的来自入射在光学透镜上的光源2的聚光,使来自光学透镜的会聚光入射到衍射光栅20,该衍射光栅具有以恒定间距布置的第一光栅槽和与第一光栅槽相交并以恒定间距布置的第二光栅槽,形成共享具有多个干涉区域的干涉条纹被从衍射光栅20发射的光相互成角度,测量共享干涉条纹的干涉区域中的一点处的光强度变化的相位,并且在不旋转衍射光栅20的情况下检测像散。通过阶段性检测像差。版权所有:(C)2004,日本特许厅和全国摄影学会

著录项

  • 公开/公告号JP2004239875A

    专利类型

  • 公开/公告日2004-08-26

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20030032153

  • 发明设计人 TAKADA KAZUMASA;GOTO KOSHU;

    申请日2003-02-10

  • 分类号G01M11/02;G02B5/18;G02B13/00;

  • 国家 JP

  • 入库时间 2022-08-21 23:33:30

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