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TEST VECTOR GENERATOR, TEST VECTOR GENERATING METHOD, FAILURE ANALYZER FOR SEMICONDUCTOR INTEGRATED CIRCUIT, AND PROGRAM FOR GENERATING TEST VECTOR
TEST VECTOR GENERATOR, TEST VECTOR GENERATING METHOD, FAILURE ANALYZER FOR SEMICONDUCTOR INTEGRATED CIRCUIT, AND PROGRAM FOR GENERATING TEST VECTOR
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机译:测试矢量发生器,测试矢量生成方法,半导体集成电路的故障分析仪以及生成测试矢量的程序
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摘要
PROBLEM TO BE SOLVED: To provide a test vector generator for generating a test vector used to test a specific domain by naming the specific domain in a semiconductor integrated circuit.;SOLUTION: Retrieval conditions are named for selecting a path allowing a signal to be transmitted therethrough in the semiconductor integrated circuit. Timing analysis is executed based on circuit information on the integrated circuit, a path is retrieved satisfying the retrieval conditions, and a path list is prepared in which cells constituting the retrieved path are put in the order of execution of timing analysis. Based on the path list, a test vector is generated for testing path delay failure of the integrated circuit. A termination condition is named for terminating the generation of the test vector. The preparation of the path list is terminated when the termination condition is satisfied.;COPYRIGHT: (C)2004,JPO
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