EVALUATING METHOD AND SYSTEM FOR ELECTROOPTICAL CRYSTAL OR MAGNETOOPTICAL CRYSTAL, TERAHERTZ LIGHT MEASURING METHOD AND SYSTEM THEREFOR

摘要

PROBLEM TO BE SOLVED: To make an electrooptical crystal or the like able to be properly evaluated.;SOLUTION: A bias voltage is appied from a voltage applying part 13 on a light conduction antenna 9, and pump pulse light is irradiated, thereby terahertz light generates from the light conduction antenna 9. The terahertz pulse light is irradiated onto a two-dimensional region of an electrooptical crystal 17 of an evaluated object. Probe pulse light polarized with a polarizer 22 is irradiated onto the two-dimensional region of the crystal 17. A two-dimensional CCD camera 24 images a two-dimensional light intensity distribution image of the probe pulse light passing the two-dimensional region of the crystal 17. Image signals are obtained from the camera 24 at each bias voltage while changing the bias voltage. Detection efficiency and a residual birefringence rate of the crystal 17 and each distribution of influence of scattering of the probe pulse light are evaluated from the relation of the bias voltage and the image signal every pixel.;COPYRIGHT: (C)2004,JPO