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ELIMINATION METHOD OF MASK LAMINATE, AND FORMATION AND ELIMINATION METHOD OF MASK LAMINATE

机译:面膜层合体的消除方法,面膜层合体的形成和消除方法

摘要

PROBLEM TO BE SOLVED: To provide an elimination method of a mask laminate wherein digging of a layer to be worked can be restrained when an once formed mask laminate is eliminated, and to provide a formation and elimination method of the mask laminate.;SOLUTION: An aperture C is formed on a lower resist film 3 by using an intermediate layer 4 whose etching tolerance is almost equal to that of a film 2 to be treated which is composed of silicon oxide or the like, as an etching mask, and the mask laminate having the intermediate layer 4 and the lower resist film 3 is formed. After that, when a pattern is determined to be imperfect and the mask laminate is eliminated without working the film 2 to be worked, a protective resist film 6 covering the film 2 which is exposed on the aperture C of the mask laminate is formed, the intermediate layer 4 on the lower resist film 3 is eliminated, and the lower resist film 3 and the protective resist film 6 are eliminated.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:提供一种掩模叠层体的消除方法,其中,在消除曾经形成的掩模叠层体时,可以抑制待加工层的开挖,并提供掩模叠层体的形成和消除方法。通过使用蚀刻耐受性几乎等于由氧化硅等构成的待处理膜2的中间层4的中间层4作为蚀刻掩模,在下抗蚀剂膜3上形成开口C。形成具有中间层4和下部抗蚀剂膜3的层叠体。此后,当确定图案不完美并且在不对要加工的膜2进行加工的情况下除去掩模层压板时,形成覆盖抗蚀剂保护膜6,该保护抗蚀剂膜6覆盖暴露在掩模层压板的开口C上的膜2,该保护抗蚀剂膜6覆盖掩模2。下部抗蚀剂膜3上的中间层4被除去,下部抗蚀剂膜3和保护性抗蚀剂膜6被除去。版权所有:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2004103901A

    专利类型

  • 公开/公告日2004-04-02

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP20020265112

  • 发明设计人 KAWASHIMA ATSUSHI;

    申请日2002-09-11

  • 分类号H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-21 23:29:22

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